EE6309 – VLSI Systems

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EE6309 – VLSI Systems
AY25/26 Semester 2 Assignment#1

Please staple this question paper with your answer sheets and submit them together Only hand-written answers on paper or tablets are accepted.

Write your answers in the empty space.

1) Assume that one of the NMOS devices in the boxed NAND2 in Figure 1 has stuck-open fault. What is the minimum number of test vectors to test the stuckopen fault? Briefly explain why.(20 Marks)

Figure 1 

Figure 2

2) Derive all the test vectors that can detect the stuck-at fault indicated in Figure 2. (10 Marks)

3) Among the test vectors derived in 2), which test vector shows the highest fault coverage? (20 Marks)

4) A sequential circuit with 2 inputs (A and B), 2-bit state memory, and 1 output (OUT) shown below needs to be tested. Find the sequence of the input vectors for testing the stuck-at fault indicated in the following sequential circuit. Assume that the initial state of the circuit is (Q1, Q2) = (0, 0). Can you reduce the number of the input vector sequence? Explain briefly.(20 Marks)

Figure 3

5) Derive the number of single stuck-at faults of the following logic circuit using fault collapsing. Use a fault diagram in the derivation. (10 Marks)

6) A BIST circuit is analyzing the signature of the input data stream (MSB)(101010110)(LSB) using Linear Feedback Shift Register (LFSR). The characteristic polynomial of the LFSR is x 4 + x2 + 1. Draw the circuit diagram of the LFSR and calculate the signature of this test. (20 Marks)

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